DocumentCode
1849039
Title
PD performance of dielectric insulations in presence of low frequency conducted disturbances: a life model approach
Author
Di Lorenzo Del Casale, M. ; Romano, P. ; Schifani, R.
Author_Institution
Dept. of Electr. Eng., Palermo Univ., Italy
fYear
2001
fDate
2001
Firstpage
294
Lastpage
297
Abstract
The problem of how 50 Hz power supply voltage distortions affect PD activity and the lifetime of epoxy resin insulation systems, is addressed. In this aim, harmonics up to the 5th were summed up to the voltage fundamental component changing the waveform from the sinusoidal into its peaked or flattened resulting shape. In a previous paper, life tests were performed using a sphere-plane electrode configuration; now the experimental research has been carried out, and an analysis of the PD aging phenomena was performed in both sinusoidal and non-sinusoidal life tests by a digital PD system. A good agreement has been:found between the physical phenomena involved during the aging and the obtained new related lifetimes. Finally, a life model is proposed to establish a functional relationship between the shape characteristics of the applied voltage and the failure times, thus providing a useful tool to evaluate the epoxy life changes due to the presence of voltage harmonics with respect to the sinusoidal supply
Keywords
ageing; epoxy insulation; harmonics; insulation testing; partial discharge measurement; 50 Hz; PD activity; aging phenomena; epoxy life changes; epoxy resin insulation systems; failure times; harmonics; life model approach; low frequency conducted disturbances; nonsinusoidal life tests; shape characteristics; sinusoidal life tests; voltage fundamental component; Aging; Dielectrics and electrical insulation; Electrodes; Epoxy resins; Life testing; Performance evaluation; Power supplies; Shape; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location
Kitchener, Ont.
Print_ISBN
0-7803-7053-8
Type
conf
DOI
10.1109/CEIDP.2001.963542
Filename
963542
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