DocumentCode :
1849061
Title :
Probability of partial discharge inception in small voids
Author :
Burgener, H.-P. ; Fröhlich, K.
Author_Institution :
Swiss Fed. Inst. of Technol., Zurich, Switzerland
fYear :
2001
fDate :
2001
Firstpage :
298
Lastpage :
302
Abstract :
Composite insulation materials may have small gaseous voids caused by the manufacture process and/or by mechanical stress. The time delay of partial discharge (PD) inception after voltage application in such small voids depends on various parameters including the gaseous volume, and it is subjected to considerable scatter. Average values for this time delay are reported in literature. However, the strong scatter implies a certain probability for the first PD, which has not been explicitly calculated so far. Therefore the probability of the inception of the first PD is calculated in this paper as a function of time and of AC (50 Hz) and DC field strength with the geometry as parameter. At first only one single cylindrical void is considered. Further, the calculation is extended to a large number of statistically distributed voids. It is shown that for sufficiently high field values the kind of voltage and the considered pressure range have a minor influence on the PD inception compared to its scatter whereas the geometry of the voids is more important. The calculation allows a better estimation of the delay of PD inception in small voids when performing measurements for material investigations and other test routines
Keywords :
composite insulating materials; delay estimation; partial discharges; probability; voids (solid); 50 Hz; AC field strength; DC field strength; PD inception; composite insulation materials; gaseous volume; geometry parameter; manufacture process; mechanical stress; partial discharge inception; probability; small gaseous voids; statistically distributed voids; time delay; void geometry; voltage application; Composite materials; Delay effects; Delay estimation; Gas insulation; Manufacturing processes; Partial discharges; Probability; Scattering; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
Type :
conf
DOI :
10.1109/CEIDP.2001.963543
Filename :
963543
Link To Document :
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