Finite Aperture Time and Sampling Jitter Effects in Wideband Data Acquisition Systems

This paper presents explicit analysis of the output error power in wideband sampling systems in the presence of finite aperture time and sampling jitter. Finite aperture time and sampling jitter are crucial for wideband sampling systems to capture high-frequency signals in high precision. Finite aperture time (or finite aperture window) works as a low pass filter and hence it degrades the high-frequency performance of sampling systems while aperture jitter misleads data acquisition timing points, which causes large errors for high-frequency (and hence large slew rate) signal acquisition. In this paper, we discuss their effects explicitly in case that not only finite aperture time and sampling jitter exist individually but also they exist together for almost any aperture window function with jitter of Gaussian distribution. These results are theoretically fundamental, and are useful for designing wideband sampling data acquisition systems. Experimental measurements are being performed to verify our theoretical results and these may be also reported at the conference.