• DocumentCode
    1849215
  • Title

    Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects

  • Author

    Glaser, U. ; Hubner, U. ; Vierhaus, H.T.

  • fYear
    1992
  • fDate
    20-24 Sep 1992
  • Firstpage
    21
  • Keywords
    Automatic test pattern generation; Circuit faults; Circuit testing; Computer science; Electrical fault detection; Fault detection; Integrated circuit interconnections; Semiconductor device modeling; Switches; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.528533
  • Filename
    528533
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1849215