• DocumentCode
    1849381
  • Title

    Global Precipitation Measurement (GPM) Microwave Imager (GMI) calibration features and predicted performance

  • Author

    Draper, David ; Newell, David

  • Author_Institution
    Ball Aerosp. & Technol. Corp., Boulder, CO, USA
  • fYear
    2010
  • fDate
    1-4 March 2010
  • Firstpage
    236
  • Lastpage
    240
  • Abstract
    The GMI, scheduled to launch in 2013, includes innovative calibration features designed to mitigate or eliminate sources of calibration error that have plagued past microwave radiometers. Solar radiation illuminating the surface of the flight calibration hot load is a common calibration problem. Tests at BATC show that hot load solar intrusion can cause a calibration error on the order of twice GMFs required uncertainty. To reduce the likelihood of hot load solar intrusion, the GMI includes stray light shrouding features around the hot load. The GMI contains a dual-calibration system with noise diodes to provide a backup calibration method in the unlikely case the hot load experiences solar intrusion. Also, the GMI program is working with coating vendors to avoid reflector emissivity problems on-orbit. GMI includes temperature sensors on the main and cold-sky reflectors to correct possible nonzero emissivity. The GMI instrument design meets the required calibration uncertainty.
  • Keywords
    atmospheric measuring apparatus; atmospheric precipitation; atmospheric radiation; atmospheric techniques; calibration; radiometry; solar radiation; GPM microwave imager; backup calibration method; calibration error; calibration features; dual-calibration system; global precipitation measurement; hot load solar intrusion; microwave radiometers; noise diodes; reflector emissivity; solar radiation; stray light shrouding features; temperature sensors; Decision support systems; GMI; calibration; hot load; radiometer; solar intrusion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Radiometry and Remote Sensing of the Environment (MicroRad), 2010 11th Specialist Meeting on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-8120-0
  • Electronic_ISBN
    978-1-4244-8121-7
  • Type

    conf

  • DOI
    10.1109/MICRORAD.2010.5559555
  • Filename
    5559555