Title :
EMI conducted emission in differential mode emanating from a SCR: phenomena and noise level prediction
Author :
Scheich, R. ; Roudet, J. ; Handel, V.
Author_Institution :
Lab. d´´Electrotech. de Grenoble, ENSIEG, St. Martin d´´Heres, France
Abstract :
An electromagnetic compatibility (EMC) analysis of a power converter is presented. In particular, the phenomena and modeling of conducted noises emission caused by a silicon controlled rectifier (SCR) are described. Theoretical results in the time as well as frequency domain are discussed and compared to the measured time signal and its spectrum
Keywords :
electromagnetic compatibility; electromagnetic interference; frequency-domain analysis; power convertors; semiconductor device models; semiconductor device noise; thyristor applications; thyristors; time-domain analysis; EMC; EMI; SCR; conducted noises emission; differential mode; electromagnetic compatibility; frequency domain; modeling; noise level prediction; power converter; silicon controlled rectifier; thyristors; time domain; time signal; Circuit topology; Diodes; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic radiation; Frequency; Noise level; Rectifiers; Thyristors; Voltage;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1993. APEC '93. Conference Proceedings 1993., Eighth Annual
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0983-9
DOI :
10.1109/APEC.1993.290767
