Title :
Space-charge-stabilization in SF6
Author :
Hinterholzer, Th ; Boeck, W.
Author_Institution :
Inst. of High Voltage Eng. & Electr. Power Transmission, Technische Univ. Munchen, Germany
Abstract :
The insulation level of gas insulated switchgear (GIS) may be influenced by defects like needle-shaped protrusions. In the case of slowly rising impulse voltages and AC stress it is enhanced by corona-stabilization. This phenomena caused by the ion drift during streamer development and the resulting space-charge is investigated. We present new experimental results about this phenomena. The paths of the breakdown channels across a point/plane gap have been recorded. The tip geometries of the protrusion, gas pressures and steepness of the applied test voltages have been varied during the experiments. Based on these results the fundamental idea of a new simulation model is presented. By electrostatic field calculations the time dependent growth of the streamer and the movement of the positive SF6-ions have been calculated for the applied geometries. It is assumed that space-charge stabilization only occurs if the velocity of the streamer growth is lower than the drift velocity of the positive ions and the ions move in front of the streamer region and reduce the electric field within the streamer
Keywords :
SF6 insulation; discharges (electric); electrostatic discharge; gas insulated switchgear; space charge; AC stress; GIS; SF6; breakdown channels; corona-stabilization; electrostatic field calculations; gas insulated switchgear; gas pressure effect; ion drift; needle-shaped protrusions; point/plane gap; positive SF6-ion movement; positive ion drift velocity; protrusion tip geometry effect; slowly rising impulse voltages; space-charge; space-charge stabilization; space-charge-stabilization; streamer development; streamer growth velocity; streamer time dependent growth; test voltage steepness effect; Electric breakdown; Electron mobility; Electrostatics; Gas insulation; Geographic Information Systems; Geometry; Stress; Switchgear; Testing; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
DOI :
10.1109/CEIDP.2001.963565