• DocumentCode
    1849973
  • Title

    Determination of the DC steady-state current density distribution using FDTD and analytical techniques

  • Author

    Gkatzianas, M.A. ; Balanis, C.A.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    3
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    750
  • Abstract
    This paper examines the application of the FDTD method to the determination of the DC steady-state current density distribution of arbitrary geometries when the excitation is an impressed current. The term DC is used in this context to denote the response of a system to any waveform which tends asymptotically to a non-zero constant. Thus, more general waveforms than the unit step function can be considered. By concentrating on the steady state only (or, equivalently, the late time response) certain physical and mathematical difficulties can be circumvented. First, by definition of DC, there is no time variation so that the problem can be formulated in terms of an electrostatic potential, which is obviously more convenient than the magnetic vector potential needed in the time-dependent case. Additionally, assuming that the released heat is such that the temperature of the system (and hence the conductivity) remains almost constant, the thermal and electrical problems can be considered to be decoupled.
  • Keywords
    computational electromagnetics; conducting bodies; current density; current distribution; electrostatics; finite difference time-domain analysis; DC steady-state current density distribution; FDTD method; arbitrary geometries; conductors; electrostatic potential; impressed current; late time response; thin cylindrical plates; thin shell approximation; variational condition; Current density; Electrostatics; Finite difference methods; Geometry; Resistance heating; Steady-state; Thermal conductivity; Time domain analysis; Time factors; Waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Conference_Location
    Columbus, OH, USA
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1220020
  • Filename
    1220020