• DocumentCode
    1850120
  • Title

    H fuzzy control for discrete affine Takagi-Sugeno fuzzy models with time delay effect

  • Author

    Chang, Wen-Jer ; Chang, Wei

  • Author_Institution
    Dept. of Marine Eng., Nat. Taiwan Ocean Univ., Keelung, Taiwan
  • Volume
    3
  • fYear
    2005
  • fDate
    2005
  • Firstpage
    1503
  • Abstract
    The affine Takagi-Sugeno (T-S) fuzzy model played a more important role in nonlinear control because it can be one of the useful control approaches for complex nonlinear systems. Besides, it is known that the time delays exist in physical systems and the previous works didn´t consider the time delay effects in the stability analysis of affine T-S fuzzy models. Hence, this paper deals with the parallel distributed compensation (PDC) based H fuzzy control problem for the discrete time-delay affine T-S fuzzy models. The synthesis for the discrete time-delay affine T-S fuzzy models is a bilinear matrix inequality (BMI) problem and it can not be solved via a convex optimization algorithm. Thus, an iterative linear matrix inequality (ILMI) algorithm is used to solve this BMI problem in this paper. Finally, a numerical simulation is given to show the applications of the proposed design approach.
  • Keywords
    H control; control system synthesis; delay systems; discrete time systems; fuzzy control; fuzzy set theory; linear matrix inequalities; nonlinear control systems; stability; H fuzzy control; bilinear matrix inequality; complex nonlinear systems; convex optimization algorithm; discrete affine Takagi-Sugeno fuzzy models; discrete time-delay affine T-S fuzzy models; iterative linear matrix inequality algorithm; nonlinear control; parallel distributed compensation; time delay effect; Control system synthesis; Delay effects; Fuzzy control; Fuzzy systems; Iterative algorithms; Linear matrix inequalities; Nonlinear control systems; Nonlinear systems; Stability analysis; Takagi-Sugeno model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechatronics and Automation, 2005 IEEE International Conference
  • Conference_Location
    Niagara Falls, Ont., Canada
  • Print_ISBN
    0-7803-9044-X
  • Type

    conf

  • DOI
    10.1109/ICMA.2005.1626778
  • Filename
    1626778