Title :
Panel: nanometer design: what hurts next....?
Author :
Pileggi, Larry ; Rutenbar, Rob
Author_Institution :
Carnegie Mellon University
Keywords :
Electronic design automation and methodology; Instruments; Physics;
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
1-58113-461-4
DOI :
10.1109/DAC.2002.1012628