• DocumentCode
    1850239
  • Title

    Option 4 of MIL-H-38534: a quality management system for building compliant hybrid microcircuits for military use

  • Author

    Jones, Michael C.

  • Author_Institution
    Defense Electron. Supply Center, Dayton, OH, USA
  • fYear
    1993
  • fDate
    24-28 May 1993
  • Firstpage
    1034
  • Abstract
    This paper describes the proposed Option 4 for the amendment of MIL-H-38534, General Specification for Hybrid Microcircuits. This paper explains the philosophy and the methods used by this option which includes the use of design analysis, design of experiments (DOE), and statistical process control (SPC). With this option, these methods may be used by the manufacturer´s Technology Review Board (TRB), a group of representatives from each major function within the hybrid area to eliminate or modify inspections and tests within the manufacturer´s Quality Conformance Inspection (QCI) and screening tests which are performed to a baselined Option 1, 2, or 3 flow. This paper explains why a manufacturer would want to implement this option and what benefits the customer will get. The manufacturer would want to get involved so that they can eliminate tests that, for their particular process and conditions, are not value-added processes. These eliminations and modifications should be seen by the customer as reduced prices for compliant hybrids, a quicker turn-around time for compliant new technology hybrids, and increased quality due to decreased handling
  • Keywords
    economics; hybrid integrated circuits; integrated circuit manufacture; military equipment; military standards; production testing; quality control; MIL-H-38534; Quality Conformance Inspection; compliant hybrid microcircuits; economics; military equipment; prices; quality management; Buildings; Hybrid integrated circuits; Inspection; Manufacturing processes; Performance evaluation; Process control; Pulp manufacturing; Quality management; Testing; US Department of Energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-1295-3
  • Type

    conf

  • DOI
    10.1109/NAECON.1993.290801
  • Filename
    290801