• DocumentCode
    1850261
  • Title

    The DESC field failure evaluation program “a cradle to grave approach”

  • Author

    Lantz, Bradley A. ; McNicholl, Brian P.

  • Author_Institution
    Defense Electron. Supply Center, Dayton, OH, USA
  • fYear
    1993
  • fDate
    24-28 May 1993
  • Firstpage
    1029
  • Abstract
    This paper describes the Defense Electronics Supply Center´s field failure evaluation program and the results achieved. The primary objective of the program is to take positive corrective action steps to assure that quality electronics parts are used in DoD weapon systems. The corrective action steps start with the validation of field failures through lab testing. Lab testing is vital in developing quantitative data and determining whether a failure is user induced or supplier related. This can be accomplished with a full compliment of testing capabilities which include electrical, physical and environmental analysis. The process flow of field failures is described from their inception to final corrective action. To illustrate this, four case studies are presented in which Lab testing and coordination with the supplier has resulted in positive corrective action thus improving the quality and reliability of the electronic components in DoD Weapon Systems
  • Keywords
    electronic equipment testing; failure analysis; military equipment; quality control; reliability; test facilities; weapons; DESC field failure evaluation program; Defense Electronics Supply Center; DoD weapon systems; corrective action; dynamic microphone; lab testing; lighting switch; process flow; quality electronics; twin unit beam power amplifier electron tube; variable air dielectric capacitors; Failure analysis; Feedback loop; Government; Management training; Manufacturing; Personnel; Quality assurance; Test facilities; Testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-1295-3
  • Type

    conf

  • DOI
    10.1109/NAECON.1993.290802
  • Filename
    290802