Title :
Description of the consolidated automated support system (CASS) electro-optical subsystem (EOSS)
Author_Institution :
Div. of Electron. Syst., Northrop Corp., Hawthorne, CA, USA
Abstract :
The CASS EOSS has been developed to provide the Navy an automated test capability for electro-optical (EO) sensors. Previous test methods required highly skilled personnel who are completely familiar with a particular EO sensor. These manual test methods required extensive test times and often involved subjective acceptance criteria. The CASS EOSS provides capability for evaluation of visible and infrared sensors, laser transmitters, receivers, trackers and multi-sensor boresight. The system is capable of performing these measurements in a rugged shipboard environment. All of the tests are performed without the use of a display or any operator intervention. This enables lower skill level personnel, with the assistance of the Test Program Set (TPS), to perform maintenance and repair on EO sensors. This results in reduction of maintenance cost with EO sensor performance maintained at a higher level in comparison to manual test methods. This paper provides a brief overview of the test capability and the evaluations performed by the CASS EOSS
Keywords :
automatic test equipment; automatic testing; electro-optical devices; infrared detectors; maintenance engineering; military equipment; naval engineering; optical communication equipment; optical receivers; transmitters; Navy; Test Program Set; automated test capability; consolidated automated support system; electro-optical sensors; electro-optical subsystem; infrared sensors; laser transmitters; maintenance; maintenance cost; multi-sensor boresight; receivers; repair; shipboard environment; subjective acceptance criteria; trackers; visible sensors; Automatic testing; Costs; Displays; Electrooptic devices; Infrared sensors; Lasers and electrooptics; Optical receivers; Optical transmitters; Performance evaluation; Personnel;
Conference_Titel :
Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1295-3
DOI :
10.1109/NAECON.1993.290808