• DocumentCode
    1850418
  • Title

    The use of pulse processing techniques to improve the performance of Cd1-xZnxTe gamma-ray spectrometers

  • Author

    Lund, J.C. ; Olsen, R. ; Van Scyoc, J.M. ; James, R.B.

  • Author_Institution
    Sandia Nat. Labs., Livermore, CA, USA
  • Volume
    1
  • fYear
    1995
  • fDate
    21-28 Oct 1995
  • Firstpage
    126
  • Abstract
    Cd1-xZnxTe (CZT) has recently shown great promise for use as a room temperature gamma-ray detector material. The availability of large volume (>1cm3) high resistivity CZT crystals has allowed the demonstration of detectors much larger than can be built with the similar material CdTe. However, CZT-like many other room-temperature materials-suffers from the poor transport properties of holes. The poor hole drift properties of CZT cause the characteristic “hole tailing” in gamma-ray pulse height spectra. We have applied pulse processing methods to reduce the hole tailing effects and improve the energy resolution of CZT detectors. We have used two signal processing methods to reduce hole tailing in CZT detectors: digital rise-time compensation and dual time-constant sampling. We discuss the implementation of these techniques, demonstrate results obtained in the laboratory, and compare the performance obtained with other detector systems
  • Keywords
    cadmium compounds; gamma-ray detection; gamma-ray spectrometers; hole traps; semiconductor counters; signal processing; ternary semiconductors; Cd1-xZnxTe gamma-ray spectrometers; CdZnTe; digital rise-time compensation; dual time-constant sampling; energy resolution; gamma-ray pulse height spectra; hole tailing; poor hole drift properties; pulse processing techniques; room temperature gamma-ray detector material; Availability; Conductivity; Crystalline materials; Crystals; Digital signal processing; Energy resolution; Gamma ray detectors; Tellurium; Temperature; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-3180-X
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1995.504192
  • Filename
    504192