Mission relevant testing

Author

Lopez, Marc ; Horman, Mel ; Luu, Thanh ; Orlando, Harold

Author_Institution

Northrop Corp., Hawthorne, CA, USA

fYear

1993

fDate

24-28 May 1993

Firstpage

987

Abstract

A methodology for determining test criteria based on specific mission requirements has been developed which allows greater flexibility in setting pass/fail criteria for automated testing. The rationale for the introduction of mission relevant testing is given along with an illustrative example of its use. The example shows how mission relevant testing can be useful in providing pass/fail criteria which maximizes the utility of sensor systems in specific missions

Keywords

automatic test equipment; automatic testing; maintenance engineering; military systems; weapons; FLIR; automated testing; flexibility; minimum resolvable temperature function; mission relevant testing; mission requirements; pass/fail criteria; sensors; targets; test criteria; threats; weapon system maintenance; weather; Aerospace electronics; Automatic testing; Electronic equipment testing; Infrared detectors; Personnel; Production facilities; Signal processing algorithms; System testing; Target recognition; Weapons;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National

Conference_Location

Dayton, OH

Print_ISBN

0-7803-1295-3

Type

conf

DOI

10.1109/NAECON.1993.290809

Filename

290809

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1850421