Design of sufficiently strongly self-checking embedded checkers for systematic and separable codes

Author

Jha, Niraj K.

Author_Institution

Dept. of Electr. Eng., Princeton Univ., NJ, USA

fYear

1989

fDate

2-4 Oct 1989

Firstpage

120

Lastpage

123

Abstract

Totally self-checking (TSC) circuits are considered. If the first erroneous output is a noncodeword then the TSC goal is said to be achieved. The author has recently defined a new class of checkers which meet the TSC goal, namely, the strongly self-checking (SSC) checkers. A TSC or SSC checker can be guaranteed to meet the TSC goal if it receives the required set of codeword tests from the functional circuit. However, in practice, it is not always possible to ensure this for embedded checkers. A design for a sufficiently strongly self-checking (SSSC) embedded checker for systematic and separable codes is presented. SSSC checkers can be used when it is impossible to design a TSC or SSC checker based on the available set of codewords from the functional circuit

Keywords

VLSI; error correction codes; TSC; codeword tests; erroneous output; functional circuit; self-checking embedded checkers; separable codes; strongly self-checking; systematic codes; Circuit faults; Circuit testing; Design methodology; Electrical fault detection; Encoding; Fault detection; Monitoring; Protection; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design: VLSI in Computers and Processors, 1989. ICCD '89. Proceedings., 1989 IEEE International Conference on

Conference_Location

Cambridge, MA

Print_ISBN

0-8186-1971-6

Type

conf

DOI

10.1109/ICCD.1989.63340

Filename

63340