DocumentCode :
1850672
Title :
Measuring the mechanical resonance frequency and quality factor of MEM resonators with well-defined uncertainties using optical interferometric techniques
Author :
Stoffels, S. ; Boedecker, S. ; Puers, R. ; De Wolf, I. ; Tilmans, H.A.C. ; Rembe, C.
Author_Institution :
IMEC, Leuven, Belgium
fYear :
2009
fDate :
21-25 June 2009
Firstpage :
549
Lastpage :
552
Abstract :
In this paper we will present a novel detection technique, based on heterodyne interferometers, from which we can accurately predict resonant-frequency and quality-factor uncertainties of mechanical resonators. We verified the technique on a rectangular bar resonator where we have measured resonance frequencies and the quality factor with relative uncertainties of plusmn0.005% and plusmn10%, respectively. Our technique is proven to 240 MHz, limited only by the bandwidth of the excitation signal, but should be scalable to 1.2 GHz.
Keywords :
Q-factor; frequency measurement; light interferometry; measurement uncertainty; micromechanical resonators; MEM resonators; frequency 240 MHz; mechanical resonance frequency measurement; mechanical resonator; optical interferometric technique; quality factor uncertainty; rectangular bar resonator; Bandwidth; Frequency measurement; Interferometers; Mechanical variables measurement; Optical interferometry; Optical mixing; Optical resonators; Q factor; Resonance; Resonant frequency; RFMEM resonators; Ultra-high frequencies; heterodyne interferometry; laser-Doppler vibrometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
Type :
conf
DOI :
10.1109/SENSOR.2009.5285383
Filename :
5285383
Link To Document :
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