• DocumentCode
    1850672
  • Title

    Measuring the mechanical resonance frequency and quality factor of MEM resonators with well-defined uncertainties using optical interferometric techniques

  • Author

    Stoffels, S. ; Boedecker, S. ; Puers, R. ; De Wolf, I. ; Tilmans, H.A.C. ; Rembe, C.

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2009
  • fDate
    21-25 June 2009
  • Firstpage
    549
  • Lastpage
    552
  • Abstract
    In this paper we will present a novel detection technique, based on heterodyne interferometers, from which we can accurately predict resonant-frequency and quality-factor uncertainties of mechanical resonators. We verified the technique on a rectangular bar resonator where we have measured resonance frequencies and the quality factor with relative uncertainties of plusmn0.005% and plusmn10%, respectively. Our technique is proven to 240 MHz, limited only by the bandwidth of the excitation signal, but should be scalable to 1.2 GHz.
  • Keywords
    Q-factor; frequency measurement; light interferometry; measurement uncertainty; micromechanical resonators; MEM resonators; frequency 240 MHz; mechanical resonance frequency measurement; mechanical resonator; optical interferometric technique; quality factor uncertainty; rectangular bar resonator; Bandwidth; Frequency measurement; Interferometers; Mechanical variables measurement; Optical interferometry; Optical mixing; Optical resonators; Q factor; Resonance; Resonant frequency; RFMEM resonators; Ultra-high frequencies; heterodyne interferometry; laser-Doppler vibrometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
  • Conference_Location
    Denver, CO
  • Print_ISBN
    978-1-4244-4190-7
  • Electronic_ISBN
    978-1-4244-4193-8
  • Type

    conf

  • DOI
    10.1109/SENSOR.2009.5285383
  • Filename
    5285383