DocumentCode :
1850710
Title :
Development of an high pressure diagnostic based on optical Raman backscatter measurements in diamond
Author :
Rodriguez, G. ; Roberts, J.P. ; Taylor, A.J. ; Gallegos, C.M.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
Volume :
1
fYear :
1997
fDate :
June 29 1997-July 2 1997
Firstpage :
442
Abstract :
High pressure diagnostics for pulsed power high energy density physics experiments require time-resolved measurements under shock loading conditions with pressures exceeding a megabar. A high pressure diagnostic based on the optical Raman spectrum in oriented crystalline diamond is discussed. By placing the diamond probe in a preferred crystallographic orientation, shock loading due to the pressure wave induces a crystal strain proportional to the applied stress. A strain induced optical frequency shift in the Raman spectrum of diamond is measured temporally with a streak camera to permit real time determination of the pressure wave amplitude. Diamond Raman should provide a first step in achieving a high pressure probe standard for shock loading conditions and large density compression studies exceeding megabar stresses.
Keywords :
Raman spectroscopy; backscatter; crystal orientation; diamond; high-pressure techniques; pressure measurement; pressure transducers; pulsed power technology; streak cameras; C; crystal strain; crystal structure; diamond; high pressure diagnostic; high pressure probe standard; optical Raman backscatter measurements; oriented crystalline diamond; preferred crystallographic orientation; pressure wave; pressure wave amplitude; pulsed power high energy density physics; shock loading; shock loading conditions; strain induced optical frequency shift; strain induced spectral splitting; streak camera; time-resolved measurements; Crystallization; Density measurement; Electric shock; Optical pulses; Physics; Pressure measurement; Probes; Pulse measurements; Strain measurement; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
Conference_Location :
Baltimore, MA, USA
Print_ISBN :
0-7803-4213-5
Type :
conf
DOI :
10.1109/PPC.1997.679371
Filename :
679371
Link To Document :
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