DocumentCode :
1850861
Title :
Ultra-thin Super High Frequency two-port ALN contour-mode resonators and filters
Author :
Rinaldi, M. ; Zuniga, C. ; Zuo, C. ; Piazza, G.
Author_Institution :
Univ. of Pennsylvania, Philadelphia, PA, USA
fYear :
2009
fDate :
21-25 June 2009
Firstpage :
577
Lastpage :
580
Abstract :
This paper reports on the demonstration of a new class of ultra-thin (250 nm thick) super high frequency (SHF) AlN piezoelectric two-port resonators and filters. A thickness field excitation scheme was employed to excite a higher order contour extensional mode of vibration in an AlN nano plate (250 nm thick) above 3 GHz and synthesize a 1.96 GHz narrow-bandwidth channel-select filter. The devices of this work are able to operate over a frequency range from 1.9 to 3.5 GHz and are employed to synthesize the highest frequency MEMS filter based on electrically self-coupled AlN contour-mode resonators. Very narrow bandwidth (~ 0.35%) and high off-band rejection (~ 35 dB) were achieved at an operating frequency of 1.96 GHz. This first prototype showed insertion loss of 11 dB, which can be improved to few dB if parasitic elements are eliminated or device capacitance is increased.
Keywords :
UHF filters; aluminium compounds; crystal filters; crystal resonators; micromechanical resonators; microwave filters; resonator filters; two-port networks; MEMS filter; frequency 1.9 GHz to 3.5 GHz; insertion loss; loss 11 dB; narrow-bandwidth channel-select filter; piezoelectric filters; size 250 nm; thickness field excitation scheme; two-port contour-mode filter; ultra-thin super high frequency two-port resonator; Aluminum nitride; Bandwidth; Frequency synthesizers; Insertion loss; Micromechanical devices; Parasitic capacitance; Prototypes; Radio frequency; Resonator filters; Substrates; MEMS filters; Resonators; Super High Frequency; aluminum nitride (AlN) film; contour-mode resonators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
Type :
conf
DOI :
10.1109/SENSOR.2009.5285390
Filename :
5285390
Link To Document :
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