Noise determination in silicon micro strips

Author

Dubbs, T. ; Kashigin, S. ; Kratzer, M. ; Kroeger, W. ; Pulliam, T. ; Sadrozinski, H.F.-W. ; Spencer, E. ; Wichmann, R. ; Wilder, M. ; Unno, Y. ; Ohsugi, T.

Author_Institution

SCIPP, California Univ., Santa Cruz, CA, USA

Volume

1

fYear

1995

fDate

21-28 Oct 1995

Firstpage

206

Abstract

We report the study of amplifier noise on silicon micro strip detectors, We have used a fast, low noise amplifier-comparator VLSI chip with 22 ns shaping time developed for the LHC to determine the noise at the preamp as a function of strip length and strip geometry, i.e., interstrip capacitance and ohmic strip resistance. In addition, we have tested the noise in irradiated detectors. We have compared the results with simulations using SPICE

Keywords

VLSI; comparators (circuits); detector circuits; nuclear electronics; position sensitive particle detectors; preamplifiers; semiconductor device noise; silicon radiation detectors; 22 ns; LHC; SPICE; Si; amplifier noise; interstrip capacitance; irradiated detectors; low noise amplifier-comparator VLSI chip; noise determination; ohmic strip resistance; preamplifier; silicon microstrips; Capacitance; Detectors; Geometry; Large Hadron Collider; Low-noise amplifiers; Noise shaping; Silicon; Strips; Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE

Conference_Location

San Francisco, CA

Print_ISBN

0-7803-3180-X

Type

conf

DOI

10.1109/NSSMIC.1995.504210

Filename

504210