Title :
Noise determination in silicon micro strips
Author :
Dubbs, T. ; Kashigin, S. ; Kratzer, M. ; Kroeger, W. ; Pulliam, T. ; Sadrozinski, H.F.-W. ; Spencer, E. ; Wichmann, R. ; Wilder, M. ; Unno, Y. ; Ohsugi, T.
Author_Institution :
SCIPP, California Univ., Santa Cruz, CA, USA
Abstract :
We report the study of amplifier noise on silicon micro strip detectors, We have used a fast, low noise amplifier-comparator VLSI chip with 22 ns shaping time developed for the LHC to determine the noise at the preamp as a function of strip length and strip geometry, i.e., interstrip capacitance and ohmic strip resistance. In addition, we have tested the noise in irradiated detectors. We have compared the results with simulations using SPICE
Keywords :
VLSI; comparators (circuits); detector circuits; nuclear electronics; position sensitive particle detectors; preamplifiers; semiconductor device noise; silicon radiation detectors; 22 ns; LHC; SPICE; Si; amplifier noise; interstrip capacitance; irradiated detectors; low noise amplifier-comparator VLSI chip; noise determination; ohmic strip resistance; preamplifier; silicon microstrips; Capacitance; Detectors; Geometry; Large Hadron Collider; Low-noise amplifiers; Noise shaping; Silicon; Strips; Testing; Very large scale integration;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3180-X
DOI :
10.1109/NSSMIC.1995.504210
