DocumentCode
1851004
Title
Internal-node waveform probing of MMIC power amplifiers
Author
Wei, C.J. ; Tkachenko, Y.A. ; Hwang, J.C.M. ; Smith, K.E. ; Peake, A.H.
Author_Institution
Lehigh Univ., Bethlehem, PA, USA
fYear
1995
fDate
15-16 May 1995
Firstpage
127
Lastpage
130
Abstract
A novel internal-node waveform probing technique has been demonstrated on a MMIC. The error of the measurement and its perturbance to circuit operation was estimated and verified to be less than 20%. Valuable insight was obtained from the variation of waveforms as a function of frequency, drive and location.<>
Keywords
MMIC power amplifiers; integrated circuit measurement; microwave measurement; waveform analysis; MMIC power amplifiers; circuit operation; internal-node waveform probing; measurement error; Calibration; Current measurement; Fingers; Integrated circuit measurements; MMICs; Power amplifiers; Power measurement; Probes; Transmission line measurements; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1995. Digest of Papers., IEEE 1995
Conference_Location
Orlando, FL, USA
Print_ISBN
0-7803-2590-7
Type
conf
DOI
10.1109/MCS.1995.470975
Filename
470975
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