DocumentCode
185107
Title
How good is bad weather?
Author
Fullmer, Daniel ; Chetty, V. ; Warnick, S.
Author_Institution
Inf. & Decision Algorithms Labs., Brigham Young Univ., Provo, UT, USA
fYear
2014
fDate
4-6 June 2014
Firstpage
2711
Lastpage
2716
Abstract
Accurately identifying key parameters in complex systems demands sufficient excitation, so that the resulting data will be informative enough to reveal hidden parameter values. In many situations, however, users choose inputs that attempt to optimize the system response, not necessarily those that yield more informative data. This leads to the classic tradeoff between exploitation and exploration in learning problems. Farmers face a similar issue. Although they would like to identify key soil parameters affecting the growth of their crops, market pressures force them to manage their product to maximize yield, resulting in less informative data. This suggests that weather, and bad weather in particular, may play a critically important role in creating informative data for crop systems by driving them into low-yield regimes that no farmer would otherwise choose to explore. This paper investigates these issues using a standard computational model for corn and real weather data. Two model-based measures characterizing any year´s weather pattern are introduced. The first measure characterizes how well a particular year´s weather pattern produces corn, according to the model. The second measure characterizes how well a particular year´s weather pattern distinguishes the way different soil types affect corn growth. We then use these measures to show that, from the perspective of corn, bad weather can indeed be very good for distinguishing soil type.
Keywords
soil; vegetation; bad weather; complex systems; crop growth; crop systems; hidden parameter values; market pressures to; real weather data; soil parameters; standard computational model; weather pattern; Agriculture; Genetics; Meteorology; Nitrogen; Productivity; Soil; Soil measurements; Control applications; Emerging control applications; Modeling and simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2014
Conference_Location
Portland, OR
ISSN
0743-1619
Print_ISBN
978-1-4799-3272-6
Type
conf
DOI
10.1109/ACC.2014.6859469
Filename
6859469
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