Title :
A general probabilistic framework for worst case timing analysis
Author :
Orshansky, Michael ; Keutzer, Kurt
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
The traditional approach to worst-case static-timing analysis is becoming unacceptably conservative due to an ever-increasing number of circuit and process effects. We propose a fundamentally different framework that aims to significantly improve the accuracy of timing predictions through fully probabilistic analysis of gate and path delays. We describe a bottom-up approach for the construction of joint probability density function of path delays, and present novel analytical and algorithmic methods for finding the full distribution of the maximum of a random path delay space with arbitrary path correlations.
Keywords :
circuit CAD; delays; logic CAD; logic gates; probability; timing; arbitrary path correlations; bottom-up approach; circuit effects; gate delays; general probabilistic framework; joint probability density function; path delays; process effects; static-timing analysis; timing predictions; worst case timing analysis; Accuracy; Algorithm design and analysis; Circuit analysis computing; Computer aided software engineering; Delay; Permission; Probability density function; Silicon; Timing; Uncertainty;
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
Print_ISBN :
1-58113-461-4
DOI :
10.1109/DAC.2002.1012687