DocumentCode
1851871
Title
Benchmarking the Compton coincidence technique for measuring electron response non-proportionality in inorganic scintillators
Author
Rooney, Brian D. ; Valentine, John D.
Author_Institution
Dept. of Mech. & Ind. Eng., Cincinnati Univ., OH, USA
Volume
1
fYear
1995
fDate
21-28 Oct 1995
Firstpage
404
Abstract
To study the light yield non-proportionality of inorganic scintillation materials, a Compton coincidence experiment has been designed and implemented. The coincidence technique is used to measure the nearly mono-energetic electron response by recording events only when energetic electrons are produced by gamma rays that are Compton scattered through a specific angle. This technique provides the ability to accurately determine the light yield non-proportionality of scintillation materials as a function electron energy while minimizing the potential effects of surface interaction and X-ray escape. To benchmark the Compton coincidence technique (CCT), the electron response for NaI(Tl) has been measured for electron energies from 2 keV to 450 keV and compared to previously-published analytical and measured light yield response data for electrons. The CCT data represent the most accurate electron response measurement to date on NaI(Tl) for energies below 20 keV. With the CCT benchmarked, the electron response non-proportionality of other scintillators can be analyzed
Keywords
Compton effect; coincidence techniques; electron detection; sodium compounds; solid scintillation detectors; thallium; 2 to 450 keV; Compton coincidence technique benchmarking; NaI(Tl); NaI:Tl; X-ray escape; electron response nonproportionality; inorganic scintillators; light yield nonproportionality; surface interaction; Design engineering; Electromagnetic wave absorption; Electron sources; Energy measurement; Gamma rays; Light scattering; Mechanical variables measurement; Nuclear measurements; Surface treatment; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-3180-X
Type
conf
DOI
10.1109/NSSMIC.1995.504254
Filename
504254
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