DocumentCode
1852051
Title
Stochastic models for short-term multipath fading channels: chi-square and Ornstein-Uhlenbeck processes
Author
Charalambous, Charalambos D. ; Menemenlis, Nickie
Author_Institution
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada
Volume
5
fYear
1999
fDate
1999
Firstpage
4959
Abstract
This paper discusses the use of stochastic differential equations to model signal envelope variations over areas, which are subject to short-term fading effects. The short-term fading effects are modeled using Ornstein-Uhlenbeck processes and they are derived from first principles, using the scattering assumption of electromagnetic waves. This gives rise to signal envelope variations which follow a mean-reverting square-root process, which is elastically pulled towards a long-term mean which characterizes the propagation environment. The derived signal envelope distributions include generalizations of Rayleigh, Rician, Nakagami etc. distributions to their nonstationary analogs and thus generalizing channel models to include time variations. From these computations the second order statistics of the received signal are obtained
Keywords
Rayleigh channels; Rician channels; differential equations; fading channels; multipath channels; radiowave propagation; statistical analysis; stochastic processes; Nakagami distributions; Ornstein-Uhlenbeck processes; Rayleigh distribution; Rician distribution; chi-square processes; electromagnetic waves; long-term mean; mean-reverting square-root process; propagation environment; scattering assumption; second order statistics; short-term fading effects; short-term multipath fading channels; signal envelope variations; stochastic differential equations; stochastic models; time variations; Differential equations; Electromagnetic modeling; Electromagnetic propagation; Electromagnetic scattering; Fading; Nakagami distribution; Rayleigh scattering; Rician channels; Signal processing; Stochastic processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 1999. Proceedings of the 38th IEEE Conference on
Conference_Location
Phoenix, AZ
ISSN
0191-2216
Print_ISBN
0-7803-5250-5
Type
conf
DOI
10.1109/CDC.1999.833332
Filename
833332
Link To Document