DocumentCode :
1852105
Title :
Multiplexing in test mode reduces pin count requirements
Author :
Yishay, Oded
Author_Institution :
Motorola Inc., Austin, TX, USA
fYear :
1995
fDate :
21-23 Jun 1995
Firstpage :
467
Lastpage :
485
Abstract :
A new integration module in the Motorola Modular Family of Microcontrollers implements a multiplexed test mode which allows internal signals to be driven even when the input pin used to drive that signal is not implemented. This test mode allows the minimum pin set that was defined for this new integration module to provide the same controllability and observability as the full pin set. This produced a significant cost savings, since it maintains the fault coverage of a large number of test patterns that were developed using previous maximum pin set integration modules
Keywords :
computer testing; controllability; integrated circuit testing; microcontrollers; observability; MC68HC16 family; MC68HC300 family; controllability; fault coverage; integration module; internal signals; maximum pin set integration modules; minimum pin set; multiplexed test mode; observability; pin count requirements; test mode; test patterns; Centralized control; Communication system control; Costs; Microcontrollers; Process control; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electro/95 International. Professional Program Proceedings.
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-2633-4
Type :
conf
DOI :
10.1109/ELECTR.1995.471026
Filename :
471026
Link To Document :
بازگشت