DocumentCode :
1852324
Title :
Measuring edge scattering from finite-sized samples using a Gaussian beam
Author :
Petersson, L.E.R. ; Smith, G.S.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
4
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
62
Abstract :
In this paper, we examine the possibility of measuring edge scattering from a material by using a Gaussian beam together with a finite-sized sample of the material. A practical implementation for measuring edge scattering is shown. Here a focused beam system, consisting of a horn antenna and a lens, produces a beam that closely resembles a Gaussian beam. The waist of the beam is centered on one edge of a finite-sized object. The object is often a thin, flat rectangular plate of some material that is being investigated for the purpose of minimizing edge scattering. The scattered field is measured, either close to or far from the object, to determine the characteristics of the edge scattering. With this system, various treatments can be applied to the edge while observing the change in the scattering. In this paper, we analyze a canonical problem. Results from this analysis are used to obtain guidelines for the conditions under which the scattering from the illuminated edge can be isolated from the scattering from the remainder of the object, viz, from the other edges of the plate.
Keywords :
antenna radiation patterns; electromagnetic wave scattering; focusing; horn antennas; E-beam; Gaussian beam; H-beam; beam waist; canonical problem; edge scattering; electromagnetic beam; far-zone patterns; finite-sized sample; flat rectangular plate; focused beam system; horn antenna; illuminated edge; perfectly conducting plate; plane waves; Antenna measurements; Beams; Contracts; Electric variables measurement; Electromagnetic measurements; Electromagnetic scattering; Guidelines; Laboratories; Lenses; Optical materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
Type :
conf
DOI :
10.1109/APS.2003.1220120
Filename :
1220120
Link To Document :
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