• DocumentCode
    1852387
  • Title

    Variable frequency crosstalk noise analysis: a methodology to guarantee functionality from dc to fmax

  • Author

    Krauter, Byron ; Widiger, David

  • Author_Institution
    IBM Corp., Austin, TX, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    665
  • Lastpage
    668
  • Abstract
    One means of reducing pessimism in crosstalk analysis is to consider timing orthogonality. While earlier works have addressed the temporal alignment of timing windows, these treatments have overlooked one key point. Crosstalk noise failures are frequency dependent. A chip that functions at one frequency can fail due to crosstalk noise at faster and slower frequencies. Moreover, because system developers and manufacturers need chips that operate over a wide range of frequencies, noise analysis tools should guarantee a wide range of operation. In this paper, we explain this phenomenon and propose a simple procedure to include timing information and guarantee functionality from dc to fmax.
  • Keywords
    crosstalk; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; timing; GCD frequency; LCM window; crosstalk noise failures; frequency-dependent noise; functionality guarantee; greatest common divisor cycle times; least common multiple cycle times; timing orthogonality; timing windows; variable frequency crosstalk noise analysis; Algorithm design and analysis; Circuit noise; Clocks; Crosstalk; Frequency; Integrated circuit noise; Manufacturing; Pins; Switches; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2002. Proceedings. 39th
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-461-4
  • Type

    conf

  • DOI
    10.1109/DAC.2002.1012708
  • Filename
    1012708