DocumentCode :
1852726
Title :
A contact position detection and interaction force monitoring sensor for micro-assembly applications
Author :
Wei, J. ; Porta, M. ; Tichem, M. ; Sarro, P.M.
Author_Institution :
Lab. of Electron. Components, Delft Univ. of Technol., Delft, Netherlands
fYear :
2009
fDate :
21-25 June 2009
Firstpage :
2385
Lastpage :
2388
Abstract :
This paper presents a piezoresistive sensor for micro-assembly application, which is capable of detecting the contact position of the micro-object on the grasping surface as well as the grasping force. By comparing the outputs of a local 2D force sensor and a global force sensor, the 2D contact position on the grasping surface and the contact force can be extracted. The device is fabricated with an IC-compatible process and can be integrated into micro-grippers. The measurement results show that different contact positions can be distinguished. The device is suitable to detect a contact force up to 4 mN, with a sensitivity of 16.4 V/N. The estimated force resolution is 1 muN.
Keywords :
force sensors; microassembling; piezoresistive devices; position measurement; contact position detection; grasping force; grasping surface; interaction force monitoring sensor; micro-assembly applications; piezoresistive sensor; Assembly; Electronic components; Force measurement; Force sensors; Laboratories; Monitoring; Nanoelectronics; Object detection; Piezoresistive devices; Position measurement; Contact position measurement; Grasping force measurement; Micro-assembly;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
Type :
conf
DOI :
10.1109/SENSOR.2009.5285453
Filename :
5285453
Link To Document :
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