DocumentCode
1852942
Title
Foreword
fYear
2008
fDate
23-25 April 2008
Abstract
Presents the introductory welcome message from the conference proceedings.
Keywords
Algorithm design and analysis; Automatic testing; CMOS process; CMOS technology; Circuit synthesis; Circuit testing; Design automation; Logic testing; Speech; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location
Hsinchu
Print_ISBN
978-1-4244-1616-5
Type
conf
DOI
10.1109/VDAT.2008.4542393
Filename
4542393
Link To Document