• DocumentCode
    1852967
  • Title

    Effective safety property checking using simulation-based sequential ATPG

  • Author

    Sheng, Shuo ; Takayama, Koichiro ; Hsiao, Michael S.

  • Author_Institution
    Dept. of ECE, Rutgers Univ., Piscataway, NJ, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    813
  • Lastpage
    818
  • Abstract
    In this paper, we present a successful application of a simulation-based sequential Automatic Test Pattern Generation (ATPG) for safety property verification, with the target on verifying safety property of large, industrial-strength, hardware designs for which current formal methods fail. Several techniques are developed to increase the effectiveness and efficiency during state exploration and justification of the test generator for verification, including (1) incorporation of a small combinational ATPG engine, (2) reset signal masking, (3) threshold-value simulation, and (4) weighted Hamming distance. Experimental results on both ISCAS89 benchmark circuits and real industry circuits have shown that this simulation-based verifier achieves better or comparable results to current state-of-the-art formal verification tools BINGO and CHAFF.
  • Keywords
    VLSI; automatic test pattern generation; circuit simulation; integrated circuit testing; logic testing; VLSI design; automatic test pattern generation; deterministic ATPG; industrial-strength hardware designs; large hardware designs; reset signal masking; safety property checking; safety property verification; simulation-based sequential ATPG; small combinational ATPG engine; state exploration; threshold-value simulation; weighted Hamming distance; Automatic test pattern generation; Benchmark testing; Circuit simulation; Circuit testing; Engines; Formal verification; Hamming distance; Hardware; Safety; Signal generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2002. Proceedings. 39th
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-461-4
  • Type

    conf

  • DOI
    10.1109/DAC.2002.1012734
  • Filename
    1012734