DocumentCode
1852967
Title
Effective safety property checking using simulation-based sequential ATPG
Author
Sheng, Shuo ; Takayama, Koichiro ; Hsiao, Michael S.
Author_Institution
Dept. of ECE, Rutgers Univ., Piscataway, NJ, USA
fYear
2002
fDate
2002
Firstpage
813
Lastpage
818
Abstract
In this paper, we present a successful application of a simulation-based sequential Automatic Test Pattern Generation (ATPG) for safety property verification, with the target on verifying safety property of large, industrial-strength, hardware designs for which current formal methods fail. Several techniques are developed to increase the effectiveness and efficiency during state exploration and justification of the test generator for verification, including (1) incorporation of a small combinational ATPG engine, (2) reset signal masking, (3) threshold-value simulation, and (4) weighted Hamming distance. Experimental results on both ISCAS89 benchmark circuits and real industry circuits have shown that this simulation-based verifier achieves better or comparable results to current state-of-the-art formal verification tools BINGO and CHAFF.
Keywords
VLSI; automatic test pattern generation; circuit simulation; integrated circuit testing; logic testing; VLSI design; automatic test pattern generation; deterministic ATPG; industrial-strength hardware designs; large hardware designs; reset signal masking; safety property checking; safety property verification; simulation-based sequential ATPG; small combinational ATPG engine; state exploration; threshold-value simulation; weighted Hamming distance; Automatic test pattern generation; Benchmark testing; Circuit simulation; Circuit testing; Engines; Formal verification; Hamming distance; Hardware; Safety; Signal generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2002. Proceedings. 39th
ISSN
0738-100X
Print_ISBN
1-58113-461-4
Type
conf
DOI
10.1109/DAC.2002.1012734
Filename
1012734
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