• DocumentCode
    1853096
  • Title

    Adapting mechanical models to fit electronics

  • Author

    Benz, Glan E. ; Bazovsky, Igor, Sr.

  • Author_Institution
    Teledyne Controls, West Los Angeles, CA, USA
  • fYear
    1990
  • fDate
    23-25 Jan 1990
  • Firstpage
    153
  • Lastpage
    156
  • Abstract
    Mechanical reliability models for given age parameters are adapted to provide electronic fatigue life distributions for the mission/test profile of stress amplitudes. This process also provides affordable life test plans. The mechanical renewal model is adapted to provide a replacement for mean time between failures (MTBF) as a design requirement and as a key to support analyses. The discussion of mechanical models and their adaptation to electronics include: a Markov deterioration model and adaptation; a interval reliability model and adaptation; an interval reliability example; and a Markov deterioration example
  • Keywords
    Markov processes; aerospace; failure analysis; reliability; Markov deterioration model; age parameters; design; electronic fatigue life distributions; failure analysis; interval reliability model; life test; mean time between failures; mechanical models; stress amplitudes; support analyses; Aerospace electronics; Aircraft propulsion; Electronic equipment testing; Equations; Fatigue; Life testing; Predictive models; Stress; Strontium; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1990. Proceedings., Annual
  • Conference_Location
    Los Angeles, CA
  • Type

    conf

  • DOI
    10.1109/ARMS.1990.67949
  • Filename
    67949