DocumentCode
1853140
Title
Coping with buffer delay change due to power and ground noise
Author
Chen, L.H. ; Marek-Sadowska, M. ; Brewer, F.
Author_Institution
Avant! Corp., Fremont, CA, USA
fYear
2002
fDate
10-14 June 2002
Firstpage
860
Lastpage
865
Abstract
Variation of power and ground levels affect VLSI circuit performance. Trends in device technology and in packaging have necessitated a revision in conventional delay models. In particular, simple scalable models are needed to predict delays in the presence of uncorrelated power and ground noise. In this paper, we analyze the effect of such noise on signal propagation through a buffer and present simple, closed-form formulas to estimate the corresponding change of delay. The model captures both positive (slowdown) and negative (speedup) delay changes. It is consistent with short-channel MOSFET behavior, including carrier velocity saturation effects. An application shows that repeater chains using buffers instead of inherently faster inverters tend to have superior supply level-induced jitter characteristics.
Keywords
VLSI; buffer circuits; delays; integrated circuit modelling; integrated circuit noise; timing jitter; VLSI circuit; buffer delay model; carrier velocity saturation; ground noise; level-induced jitter; power noise; repeater chain; short-channel MOSFET; signal propagation; Circuit noise; Circuit optimization; Delay effects; Delay estimation; MOSFET circuits; Packaging; Predictive models; Propagation delay; Signal analysis; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2002. Proceedings. 39th
Conference_Location
New Orleans, LA, USA
ISSN
0738-100X
Print_ISBN
1-58113-461-4
Type
conf
DOI
10.1109/DAC.2002.1012742
Filename
1012742
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