• DocumentCode
    1853140
  • Title

    Coping with buffer delay change due to power and ground noise

  • Author

    Chen, L.H. ; Marek-Sadowska, M. ; Brewer, F.

  • Author_Institution
    Avant! Corp., Fremont, CA, USA
  • fYear
    2002
  • fDate
    10-14 June 2002
  • Firstpage
    860
  • Lastpage
    865
  • Abstract
    Variation of power and ground levels affect VLSI circuit performance. Trends in device technology and in packaging have necessitated a revision in conventional delay models. In particular, simple scalable models are needed to predict delays in the presence of uncorrelated power and ground noise. In this paper, we analyze the effect of such noise on signal propagation through a buffer and present simple, closed-form formulas to estimate the corresponding change of delay. The model captures both positive (slowdown) and negative (speedup) delay changes. It is consistent with short-channel MOSFET behavior, including carrier velocity saturation effects. An application shows that repeater chains using buffers instead of inherently faster inverters tend to have superior supply level-induced jitter characteristics.
  • Keywords
    VLSI; buffer circuits; delays; integrated circuit modelling; integrated circuit noise; timing jitter; VLSI circuit; buffer delay model; carrier velocity saturation; ground noise; level-induced jitter; power noise; repeater chain; short-channel MOSFET; signal propagation; Circuit noise; Circuit optimization; Delay effects; Delay estimation; MOSFET circuits; Packaging; Predictive models; Propagation delay; Signal analysis; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2002. Proceedings. 39th
  • Conference_Location
    New Orleans, LA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-461-4
  • Type

    conf

  • DOI
    10.1109/DAC.2002.1012742
  • Filename
    1012742