DocumentCode :
1853140
Title :
Coping with buffer delay change due to power and ground noise
Author :
Chen, L.H. ; Marek-Sadowska, M. ; Brewer, F.
Author_Institution :
Avant! Corp., Fremont, CA, USA
fYear :
2002
fDate :
10-14 June 2002
Firstpage :
860
Lastpage :
865
Abstract :
Variation of power and ground levels affect VLSI circuit performance. Trends in device technology and in packaging have necessitated a revision in conventional delay models. In particular, simple scalable models are needed to predict delays in the presence of uncorrelated power and ground noise. In this paper, we analyze the effect of such noise on signal propagation through a buffer and present simple, closed-form formulas to estimate the corresponding change of delay. The model captures both positive (slowdown) and negative (speedup) delay changes. It is consistent with short-channel MOSFET behavior, including carrier velocity saturation effects. An application shows that repeater chains using buffers instead of inherently faster inverters tend to have superior supply level-induced jitter characteristics.
Keywords :
VLSI; buffer circuits; delays; integrated circuit modelling; integrated circuit noise; timing jitter; VLSI circuit; buffer delay model; carrier velocity saturation; ground noise; level-induced jitter; power noise; repeater chain; short-channel MOSFET; signal propagation; Circuit noise; Circuit optimization; Delay effects; Delay estimation; MOSFET circuits; Packaging; Predictive models; Propagation delay; Signal analysis; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
Conference_Location :
New Orleans, LA, USA
ISSN :
0738-100X
Print_ISBN :
1-58113-461-4
Type :
conf
DOI :
10.1109/DAC.2002.1012742
Filename :
1012742
Link To Document :
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