DocumentCode
1853229
Title
Measuring the on wafer noise figure of a W-band LNA - an application
Author
Burns, John Gregory ; Fudem, Howard ; Murphy, Michael R.
Author_Institution
Northrop Grumman Corp., Linthicum, MD, USA
fYear
2005
fDate
38520
Abstract
A method to measure the noise figure of a three stage W-band low noise amplifier (LNA) is described. Measurement results of noise figure and s-parameter gains are compared.
Keywords
MMIC amplifiers; S-parameters; integrated circuit noise; microwave measurement; MMIC; W-band LNA; low noise amplifier; noise figure measurement; s-parameter gain; Equations; Gain measurement; Laboratories; Loss measurement; Low-noise amplifiers; Noise figure; Noise measurement; Probes; Scattering parameters; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest, 2005. Spring 2005. 65th
Print_ISBN
0-7803-8858-5
Type
conf
DOI
10.1109/ARFTGS.2005.1500566
Filename
1500566
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