Title :
Record large area P-type CZ production cell efficiency of 19.3% based on LDSE technology
Author :
Hallam, Brett ; Wenham, Stuart ; Chong, Chee Mun ; Sugianto, Adeline ; Mai, Ly ; Edwards, Matt ; Jordan, David ; Fath, Peter
Author_Institution :
UNSW, Kensington, NSW, Australia
Abstract :
Summary form only given. A record independently confirmed production cell efficiency of 19.3% is presented for a large area P-type CZ silicon solar cell, based on the UNSW laser doped selective emitter technology. In this work, the innovative and patented laser doping technology is simply added to a standard Centrotherm turnkey line, operating with a modified process and the addition of the laser doping and light induced plating steps. Impressively, this record efficiency is achieved by using standard commercial grade p-type CZ grown silicon wafers on standard production equipment and exceeds the previous independently confirmed record for any technology of 19.2% using a standard aluminium back surface field with full rear coverage. The avoidance of laser induced defects is discussed in this work, to overcome previous limitations of the laser doping technology using conventional Q-switched lasers or the laser chemical processing method. It is demonstrated that the use of appropriate lasers can avoid thermal cycling whilst still allowing for the sufficient mixing of dopants, and allow laser doping to be performed through a standard SiN layer with contacts formed through a self-aligning metallisation scheme.
Keywords :
Q-switching; aluminium; doping; elemental semiconductors; laser materials processing; metallisation; silicon; solar cells; LDSE technology; Q-switched laser; Si; UNSW laser doped selective emitter technology; dopants mixing; full rear coverage; large area P-type CZ silicon solar cell; laser chemical processing method; laser induced defect; light induced plating steps; patented laser doping technology; record independently confirmed production cell efficiency; record large area P-type CZ production cell efficiency; self-aligning metallisation scheme; standard Centrotherm turnkey line; standard aluminium back surface field; standard commercial grade p-type CZ grown silicon wafers; standard production equipment; thermal cycling; Chemical lasers; Doping; IEEE Xplore; Laser applications; Production; Silicon; Surface emitting lasers;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6185842