1853293

Three-port RF characterization of MOS transistors

Mahalingam, Umashankar ; Rustagi, Subhash C. ; Samudra, Ganesh S.

Inst. of Microelectron., Singapore

2005

38520

56

61

MOSFET; S-parameters; equivalent circuits; microwave transistors; multiport networks; 2-port RF measurements; 3-port admittance matrix; 3-port admittance network parameters; 3-port capacitance coefficients; GPG probe impedance; MOS transistors; cut-off frequency; de-embedded admittance parameters; equivalent circuit; ground power ground probe; non-ideal short; nonquasistatic channel conduction; scattering parameters measurement; three-port RF characterization; y-parameter data; Admittance measurement; Capacitance measurement; Cutoff frequency; Equivalent circuits; Frequency measurement; Impedance measurement; MOSFET circuits; Probes; Radio frequency; Time measurement;

English

ieee

ARFTG Conference Digest, 2005. Spring 2005. 65th

0-7803-8858-5

conf

10.1109/ARFTGS.2005.1500569

1500569