Pulsed-IV pulsed-RF measurements using a large signal network analyzer

A new pulsed-IV pulsed-RF measurement system using a large signal network analyzer (LSNA) is proposed to address the problem of desensitization afflicting conventional pulsed-RF measurement systems. Several extraction methods using the entire spectrum measured by the system are presented to extract non-desensitized pulsed-RF S-parameters of a transistor. The comparison of the calculated S-parameters using the least-square fitting in time domain with those using only the fundamental tone reveals the significant increase in dynamic range achieved by the proposed measurement scheme.