DocumentCode
1853326
Title
Reliability analysis of fault-tolerance voyage data recorder system
Author
Hao, Yanling ; Zhou, Wenjun
Author_Institution
Coll. of Autom., Harbin Eng. Univ., China
Volume
4
fYear
2005
fDate
29 July-1 Aug. 2005
Firstpage
2190
Abstract
The paper expounded the reliability of voyage data recorder (VDR) system, modeled and analyzed the system by classical analytical method Markov model focused on VDR that can be spot maintained. Then concluded that the reliability of double fault-tolerance system will be enhance by more 2000 times than single-processing system. This conclusion fits for the worked fact of VDR.
Keywords
Markov processes; data recording; fault tolerance; reliability theory; Markov model; double fault-tolerance system; modeling analysis technology; reliability analysis; single-processing system; voyage data recorder system; Accidents; Analytical models; Assembly; Automation; Boats; Data engineering; Educational institutions; Fault tolerant systems; Maintenance engineering; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronics and Automation, 2005 IEEE International Conference
Print_ISBN
0-7803-9044-X
Type
conf
DOI
10.1109/ICMA.2005.1626904
Filename
1626904
Link To Document