Title :
On peculiarities of S-parameter measurements
Author :
Rolain, Y. ; Van Moer, Wendy ; Jargon, Jeff ; DeGroot, Don
Author_Institution :
Dept. ELEC/TW, Vrije Universiteit, Brussels, Belgium
Abstract :
Measured S-parameters are a key factor in many measurement and/or modeling applications. Experience teaches that quantities that are derived from the measurements can contain spikes, and that they tend to grow with connection imperfections. In this paper, a possible theory is provided and the presence of the peaks is shown in practical measurements. The measured propagation constant (γ((ω)) and characteristic impedance (Z0(ω)) of a transmission line are used as an illustrative example.
Keywords :
S-parameters; electric impedance measurement; microwave measurement; transmission lines; S-parameter measurement; characteristic impedance; propagation constant; transmission line; Connectors; Force measurement; Frequency measurement; Impedance measurement; Microwave measurements; Permittivity measurement; Propagation constant; Radio frequency; Scattering parameters; Transmission line measurements;
Conference_Titel :
ARFTG Conference Digest, 2005. Spring 2005. 65th
Print_ISBN :
0-7803-8858-5
DOI :
10.1109/ARFTGS.2005.1500572
