Title :
Transfer function method for diagnostics of electronic circuit boards exposed to mechanical vibrations
Author :
Skormin, Victor A. ; Plaskon, Steven L. ; Popyack, Leonard J.
Author_Institution :
Rome Lab., Griffiss AFB, NY, USA
Abstract :
Environmental stress plays a critical role in failure and long term reliability of aerospace electronics. Vibration monitoring can provide information characterizing the structural integrity of a circuit board assembly. A frequency domain diagnostic technique extracting this information is proposed. It allows for on-line monitoring of the mechanical integrity of circuit boards, detection of existing degradation trends, and prediction of possible failures
Keywords :
aerospace computing; aerospace instrumentation; electronic engineering computing; environmental testing; failure analysis; fast Fourier transforms; fault location; printed circuit testing; reliability; transfer functions; vibration measurement; FFT; PCB; aerospace electronics; circuit board assembly; degradation; diagnostics; environmental stress; failure; frequency domain diagnostic technique; long term reliability; mechanical integrity; mechanical vibrations; online monitoring; prediction of failures; structural integrity; transfer function; vibration monitoring; Aerospace electronics; Assembly; Condition monitoring; Data mining; Electronic circuits; Frequency domain analysis; Printed circuits; Stress; Transfer functions; Vibrations;
Conference_Titel :
Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1295-3
DOI :
10.1109/NAECON.1993.290958
