• DocumentCode
    1853702
  • Title

    Investigation of quantum dot enhanced triple junction solar cells

  • Author

    Kerestes, Christopher ; Polly, Stephen ; Forbes, David ; Bailey, Christopher ; Hubbard, Seth ; Spann, John ; Patel, Pravin ; Sharps, Paul

  • Author_Institution
    NanoPower Res. Labs., Rochester Inst. of Technol., Rochester, NY, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    InAs quantum dots have been incorporated into the middle junction of an InGaP/(In)GaAs/Ge triple junction solar cell (TJSC) on four inch wafers, in aims of band gap engineering a high efficiency solar cell to even higher limits. Results of QD growth on 4” diameter Ge templates gave densities near 1×1011 cm-3 and QD height between 2-5 nm. Arrays of 10 layers of InAs QDs have been grown between the base and emitter in the middle cell of a full triple junction solar cell. Control triple junction cells that received growth interrupts without QD growth showed similar results (within 5 mV open circuit voltage) to standard triple junction cells without an interrupt. Integrated current of the (In)GaAs junction with 10 layers of strain balanced InAs QD layers shows a gain of 0.37 mA/cm2 beyond the band edge. One sun AM0 current-voltage measurements of QD TJSC show an efficiency of 26.9% with a Voc of 2.57 V.
  • Keywords
    III-V semiconductors; electrical conductivity measurement; gallium arsenide; gallium compounds; indium compounds; semiconductor quantum dots; solar cells; Ge; InGaP-InGaAs-Ge; QD TJSC; QD growth; QD height; QD layers; band edge; band gap engineering; control triple junction solar cells; high efficiency solar cell; integrated current; middle junction; quantum dot enhanced triple junction solar cells; sun AMO current-voltage measurement; voltage 2.57 V; Current measurement; Gallium arsenide; Junctions; Photonic band gap; Photovoltaic cells; Photovoltaic systems; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6185860
  • Filename
    6185860