Title :
Managing soft errors in ASICs
Author :
Wissel, Larry ; Pheasant, Scott ; Loughran, Rory ; LeBlanc, Chris ; Klaasen, Bill
Author_Institution :
IBM Microelectron., Essex Junction, VT, USA
Abstract :
Although the industry has long known about soft errors, customer awareness and concern about soft errors has recently increased. Advances in customer education, estimation techniques, and materials quality assist an ASIC designer in reducing soft-error system fails.
Keywords :
VLSI; application specific integrated circuits; integrated circuit design; integrated circuit reliability; random-access storage; ASICs; customer awareness; customer education; estimation techniques; materials quality; soft error management; system fails; Application specific integrated circuits; Boron; Clocks; Flip-flops; Inverters; Lead; Neutrons; Packaging; Pulse circuits; Random access memory;
Conference_Titel :
Custom Integrated Circuits Conference, 2002. Proceedings of the IEEE 2002
Print_ISBN :
0-7803-7250-6
DOI :
10.1109/CICC.2002.1012772
