DocumentCode
1853890
Title
Digital DC Resistance Tester
Author
Chang, Tieyuan ; Zhang, Jingjing ; Chen, Wenjun
Author_Institution
Coll. of Electron. & Inf. Eng., Hebei Univ., Baoding, China
fYear
2010
fDate
22-24 Jan. 2010
Firstpage
177
Lastpage
179
Abstract
This test method adopted the method of four-wire test to eliminate the influence of the lead resistance and the contact resistance effectively. And design the automatically selects the range of the circuit to measure the values of different resistance. We use two A/D converters to enlarge the values of voltage and current at the same time, and using software programming to realize the processing and displaying of the data.
Keywords
DC amplifiers; analogue-digital conversion; automatic testing; contact resistance; network synthesis; A-D converters; contact resistance; digital DC resistance tester; four-wire test; lead resistance; precision instrumentation amplifier ICL7650; software programming; Circuit testing; Contact resistance; Current measurement; Educational institutions; Electric resistance; Electrical resistance measurement; Electronic equipment testing; Instruments; Strain measurement; Voltage; A/D transformation; Amplifier; MCS; small resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Future Networks, 2010. ICFN '10. Second International Conference on
Conference_Location
Sanya, Hainan
Print_ISBN
978-0-7695-3940-9
Electronic_ISBN
978-1-4244-5667-3
Type
conf
DOI
10.1109/ICFN.2010.54
Filename
5431859
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