DocumentCode
1854399
Title
Investigation of failure patterns of desktop computer power supplies using a lightning surge simulator and the generation of a database for a comprehensive surge propagation study
Author
James, Sisira ; Kularatna, Nihal ; Steyn-Ross, Alistair ; Pandey, Amit ; Künnemeyer, Rainer ; Tantrigoda, Dhammika
Author_Institution
Univ. of Waikato, Hamilton, New Zealand
fYear
2010
fDate
7-10 Nov. 2010
Firstpage
1275
Lastpage
1280
Abstract
According to the International Technology Roadmap for Semiconductors (ITRS) future VLSI devices of gigahertz capability are expected to have feature sizes below 45 nm with DC power supply requirements with sub 1V and the equivalent noise voltages close to the DC rail values. This scenario makes the surge resist capability of processor type loads and the associated power conversion interfaces with lot of power semiconductors, seriously vulnerable to lightning and other power transients. In a major research project to predict the propagation of transients within the power conversion interfaces using wavelet transform, it was necessary to develop an experimental database of surge failures in power electronic subsystems. This paper highlights the results of destructive testing of desk top PC power supplies using a lightning surge simulator which will be used for comparing experimental data with analytical/simulated results.
Keywords
lightning protection; power conversion; power supplies to apparatus; power system transients; surge protection; DC power supply; ITRS; International Technology Roadmap for Semiconductors; VLSI devices; database generation; desktop computer power supplies; failure patterns investigation; lightning surge simulator; power conversion; power electronic subsystems; power semiconductors; power transients; surge propagation study; transients propagation; wavelet transform; Power supplies; Rails; Surge protection; Surges; Switches; Transient analysis; Uninterruptible power systems;
fLanguage
English
Publisher
ieee
Conference_Titel
IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
Conference_Location
Glendale, AZ
ISSN
1553-572X
Print_ISBN
978-1-4244-5225-5
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2010.5675553
Filename
5675553
Link To Document