DocumentCode :
1855133
Title :
A Bayesian methodology for assessing reliability during product development
Author :
Kaplan, S. ; Cunha, G.D.M. ; Dykes, A.A. ; Shaver, D.
Author_Institution :
Pickard, Lowe & Garrick, Newport Beach, CA, USA
fYear :
1990
fDate :
23-25 Jan 1990
Firstpage :
205
Lastpage :
209
Abstract :
Discussed are two issues of concern to the defense acquisition community: how to develop a reasonably accurate assessment of weapons system reliability in a small sample environment, and, in the absence of extensive testing, how to assess the impact of corrective action on reliability growth. A stepwise process is described for analyzing failure data derived from various sources: subassembly level, system level (factory), system level (field) and operational testing. Bayes theory is applied in a sequential manner to the various levels of testing. The prior-distribution and updating procedures at each level involve using engineering judgement to evaluate the relevance of the various kinds of tests, the significance of failures observed, and the effectiveness of corrective actions. The application of the Bayesian process sets the language and format that provide a framework for gathering, organizing, and incorporating the expert knowledge and consensus of the entire engineering team into the assessment of reliability growth
Keywords :
Bayes methods; failure analysis; military equipment; reliability; weapons; Bayesian methodology; corrective action; engineering judgement; failure analysis; military systems; product development; reliability; small sample environment; stepwise process; testing; weapons; Bayesian methods; Data analysis; Failure analysis; Knowledge engineering; Organizing; Production facilities; Reliability engineering; Sequential analysis; System testing; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location :
Los Angeles, CA
Type :
conf
DOI :
10.1109/ARMS.1990.67957
Filename :
67957
Link To Document :
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