Title :
Fluorescence imaging for analysis of the degradation of PV-modules
Author :
Roeder, Beate ; Schlothauer, Jan ; Koehl, Michael
Author_Institution :
Humboldt-Univ. zu Berlin, Berlin, Germany
Abstract :
Fluorescence detection is presented as a tool for the investigation of EVA degradation that is used as encapsulant in PV-modules. The superior sensitivity of our set-up allows an early assessment of ageing processes in EVA already after 20h damp-heat exposure. A newly developed scanning system enables the laterally resolved inspection of entire PV modules. We also report the evaluation of outdoor weathered crystalline Si-modules demonstrating that besides ageing of EVA cracks of cells are well detectable, too.
Keywords :
ageing; cracks; elemental semiconductors; encapsulation; fluorescence spectroscopy; polymer blends; silicon; solar cells; EVA cracks; EVA degradation; Si; ageing; damp heat exposure; fluorescence detection; fluorescence imaging; laterally resolved inspection; photovoltaic modules; time 20 h; weathered crystalline Si modules; Aging; Degradation; Fluorescence; Imaging; Photovoltaic systems; Plastics;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6185928
