DocumentCode :
1855243
Title :
An iDD transient analysis technique for defect detection in digital integrated circuits
Author :
Beasley, Jeff ; Ramirez-Angulo, Jaime ; Steiner, Robert
Author_Institution :
Dept. of Eng. Technol., New Mexico State Univ., Las Cruces, NM, USA
Volume :
1
fYear :
1995
fDate :
13-16 Aug 1995
Firstpage :
286
Abstract :
This paper presents a unique method for detecting defects in digital integrated circuits by analyzing the changes observed in the transient power supply currents for the device under test. The transient currents are generated by simultaneously pulsing the VDD and VSS power supply rails using a technique called iDD Pulse Response Testing
Keywords :
digital integrated circuits; fault diagnosis; integrated circuit testing; transient analysis; defect detection; digital integrated circuits; power supply current; pulse response testing; transient analysis; Circuit analysis; Circuit testing; Current supplies; Digital integrated circuits; Integrated circuit testing; Power generation; Power supplies; Pulse generation; Pulsed power supplies; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2972-4
Type :
conf
DOI :
10.1109/MWSCAS.1995.504433
Filename :
504433
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1855243
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