Title :
CMOS current reference generator using integrated resistors
Author :
Chun, Hosung ; Lehmann, Torsten
Author_Institution :
Sch. of Electr. Eng. & Telecommun., Univ. of New South Wales, Sydney, NSW, Australia
Abstract :
A novel method is proposed that can generate a stable reference current using on-chip integrated resistors without the use of trimming. By optimally combining different types of integrated resistors, the overall resistance variability is reduced below that of the most accurate available resistor. Combining such a resistance with a band-gap reference and a temperature compensation circuit, we implement an on-chip current reference. This circuit is implemented using a standard 0.35um CMOS process with 3V power supply. Monte-Carlo simulations show a nominal reference current (1uA) from a combined resistor varies by ±11.5% over a -10°C to 70°C temperature range. This variation is reduced by a factor of two compared with using a normal resistor. The measured values of the combined resistor and the normal resistor are 1.08MΩ and 1.45MΩ, respectively. This is -10% and +20% deviation from the desired value of 1.2MΩ.
Keywords :
CMOS integrated circuits; Monte Carlo methods; electric resistance; resistors; CMOS current reference generator; CMOS process; Monte-Carlo simulation; band-gap reference; current 1 muA; on-chip current reference; on-chip integrated resistor; overall resistance variability; size 0.35 mum; stable reference current; temperature -10 C to 70 C; temperature compensation circuit; voltage 3 V; CMOS integrated circuits; Current measurement; Photonic band gap; Resistance; Resistors; Temperature distribution; Temperature measurement; CMOS bias Current Generator; CMOS reference Current; VLSI Design;
Conference_Titel :
Electronics and Information Engineering (ICEIE), 2010 International Conference On
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-7679-4
Electronic_ISBN :
978-1-4244-7681-7
DOI :
10.1109/ICEIE.2010.5559872
