Title :
On using IEEE 1500 standard for functional testing
Author :
Ali, Ghazanfar ; Hussin, Fawnizu Azmadi ; Ali, Noohul Basheer Zain ; Hamid, Nor Hisham
Author_Institution :
Electr. & Electron. Eng. Dept., Univ. Teknol. Petronas, Tronoh, Malaysia
Abstract :
In core based design (i.e. System on Chip) testing, IEEE 1500 standard has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in the functional mode. In this paper, a proposed method to enhance the IEEE 1500 standard for functional testing in order to increase observability during functional test is discussed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on SAYEH processor in order to test it using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the modification to the IEEE 1500 standard enables it to be used for functional testing, with increased observability.
Keywords :
IEEE standards; electronic engineering computing; logic design; logic testing; system-on-chip; IEEE 1500 standard; SAYEH processor; SBST technique; core based design; embedded software based self-testing; functional testing; system-on-chip testing; Observability; Shift registers; Standards; System-on-chip; Testing; Vectors; Functional Testing; IEEE 1500 Standard; SBST;
Conference_Titel :
Quality Electronic Design (ASQED), 2013 5th Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4799-1312-1
DOI :
10.1109/ASQED.2013.6643561
