DocumentCode :
1855399
Title :
Comparison of millimeter wave dielectric measurement using various techniques
Author :
Afsar, M.N. ; Moonshiram, A. ; Yong Wang
Author_Institution :
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
Volume :
4
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
627
Abstract :
Four different systems namely the open resonator system, the DFTS, the BWO W-band spectrometer and the broadband free-space measurement system are used to compare the permittivity and loss tangent values obtained when several polymers are measured over the millimeter wave frequencies. Random and systematic error analysis are performed on permittivity and loss tangent values by comparing the dielectric data obtained from the four different systems. Uncertainty analysis is performed on a number of materials as nylon, plexiglass, high-density polyethylene, polypropylene and Teflon. Additionally, systematic error analysis is performed when such polymers as acrylic and fiberglass resin are compared at the W-band frequencies using the DFTS and the BWO W-band spectrometer.
Keywords :
Fourier transform spectroscopy; backward wave oscillators; dielectric loss measurement; measurement errors; millimetre wave measurement; permittivity measurement; polymers; BWO W-band spectrometer; Teflon; broadband free-space measurement; dispersive Fourier transform spectroscopy; high-density polyethylene; loss tangent; measurement techniques comparison; millimeter wave dielectric measurement; nylon; open resonator system; permittivity measurement; plexiglass; polymers; polypropylene; random error; systematic error; Dielectric loss measurement; Dielectric measurements; Error analysis; Frequency measurement; Loss measurement; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Polymers; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
Type :
conf
DOI :
10.1109/APS.2003.1220352
Filename :
1220352
Link To Document :
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